High Quality Test Pattern Generation and Boolean Satisfiability J. Koerting 2SAP R/3 System - A

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High Quality Test Pattern Generation and Boolean Satisfiability J. Koerting 2SAP R/3 System - AThis book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT based ATPG framework is presented which is also able to generate high quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and